Control of manufacturing processes
Master
In Maynard (USA)
Description
-
Type
Master
-
Location
Maynard (USA)
-
Start date
Different dates available
This course explores statistical modeling and control in manufacturing processes. Topics include the use of experimental design and response surface modeling to understand manufacturing process physics, as well as defect and parametric yield modeling and optimization. Various forms of process control, including statistical process control, run by run and adaptive control, and real-time feedback control, are covered. Application contexts include semiconductor manufacturing, conventional metal and polymer processing, and emerging micro-nano manufacturing processes.
Facilities
Location
Start date
Start date
Reviews
Subjects
- Manufacturing Process
- Process Control
- Engineering
- Materials
- Design
Course programme
Lectures: 2 sessions / week, 1.5 hours / session
Either or both 2.010, 15.075 or equivalent (either or both statistics or classical controls).
Montgomery, Douglas C. Introduction to Statistical Quality Control. 5th ed. New York, NY: Wiley, 2004. ISBN: 9780471656319.
May, Gary S., and Costas J. Spanos. Fundamentals of Semiconductor Manufacturing and Process Control. Hoboken, NJ: Wiley-Interscience, 2006. ISBN: 9780471784067.
Kalpakjian, S. Manufacturing Processes for Engineering Materials. 3rd ed. Menlo Park, CA: Addison Wesley, 1996. ISBN: 9780201823707.
Devor, R. E., T. Chang, and J. W. Sutherland. Statistical Quality Design and Control. New York, NY: Macmillan, 1992. ISBN: 9780023291807.
Hogg, R. V., and J. Ledotter. Engineering Statistics. New York, NY: Macmillan, 1987. ISBN: 9780023557903.
Bendat, J. S., and A. G. Piersol. Random Data. 2nd ed. New York, NY: Wiley Interscience, 2000. ISBN: 9780471317333.
Ogata, Katsuhiko. Modern Control Engineering. 3rd ed. Upper Saddle River, NJ: Prentice Hall, 1996. ISBN: 9780132273077.
Friedland, B. Control System Design. New York, NY: McGraw Hill, 1985. ISBN: 9780070224414.
All except Optimization Project are to be individual efforts.
Don't show me this again
This is one of over 2,200 courses on OCW. Find materials for this course in the pages linked along the left.
MIT OpenCourseWare is a free & open publication of material from thousands of MIT courses, covering the entire MIT curriculum.
No enrollment or registration. Freely browse and use OCW materials at your own pace. There's no signup, and no start or end dates.
Knowledge is your reward. Use OCW to guide your own life-long learning, or to teach others. We don't offer credit or certification for using OCW.
Made for sharing. Download files for later. Send to friends and colleagues. Modify, remix, and reuse (just remember to cite OCW as the source.)
Learn more at Get Started with MIT OpenCourseWare
Control of manufacturing processes