A new approach for highly accurate optical interferometry measurements in nanotechnology

A fully funded PhD studentship is available in the area of highly accurate optical measurements for nanotechnological applications. The internationally renowned Centre for Engineering Photonics takes novel photonics based techniques and develops them into real-world applications for the benefit of society. We are a diverse, outward-facing research activity, and many of our projects involve collaboration with other academic groups (national and international), instrumentation manufacturers and end users. The project shall explore the potential of our recently developed technique for spatially resolved interferometry for high-accuracy (sub-nm) optical distance measurements. This new approach enables the use of unconventional and very compact optical setups and therefore has the potential to benefit a wide range of high-accuracy applications in nanoscience and technology, such as surface probe microscopy or semiconductor manufacturing. One of the important challenges to be solved in this project is how to improve the calibration of the laser emission wavelength, ideally using an atomic absorption line reference to make the measurements meteorologically traceable. Most of the work will be performed in our well-equipped laboratories, while it is intended that some short performance verification experiments will be carried out in collaboration with the National Physical Laboratory (NPL) in Teddington. This project will enable the student to acquire a unique skillset in the growing field of high-accuracy optical measurement for nanoscience and nanotechnological applications. The project would suit candidates with a background in the physical sciences or relevant engineering subjects. Experience in photonics would be an advantage, but an ability to learn and to apply that learning are considered equally important, as full training will be provided in photonics techniques. Additionally all students are encouraged to complete a programme of...